SEM analysis:
SEM analysis is a member of the scanning electron microscope family and is used to examine the surface characteristics and morphology of different samples. In this method, electron beams with specific energy and wavelength sweep the sample surface [25-27]. By the detector data that have collected the return sample surface electrons, benefits data is obtained from the sample surface. It should be noted that image quality and high resolution in the images have a direct relationship with the structure of the sample and the quality of synthesis and the absence of contamination and unwanted particles, and samples with a specific structure provide acceptable images [28-32].
Figure 2 presents the FE-SEM images of images VNPs@Salvia officinalis . According to the results, a spherical shape is observed for the morphology of the synthetic NPs with the range size of 11.28 to 40.74 nm. The vanadium nanoparticles exhibit a propensity to aggregate that has been reported as a property for green synthetic metallic NPs including vanadium and others such as titanium, silver, and nickel [24-27]. The reported size for the green synthesized vanadium is in a range of 10 to 100 nm in the literature [28-32].