SEM analysis:
SEM analysis is a member of the scanning electron microscope family and
is used to examine the surface characteristics and morphology of
different samples. In this method, electron beams with specific energy
and wavelength sweep the sample surface [25-27]. By the detector
data that have collected the return sample surface electrons, benefits
data is obtained from the sample surface. It should be noted that image
quality and high resolution in the images have a direct relationship
with the structure of the sample and the quality of synthesis and the
absence of contamination and unwanted particles, and samples with a
specific structure provide acceptable images [28-32].
Figure 2 presents the FE-SEM images of images VNPs@Salvia
officinalis . According to the results, a spherical shape is observed
for the morphology of the synthetic NPs with the range size of 11.28 to
40.74 nm. The vanadium nanoparticles exhibit a propensity to aggregate
that has been reported as a property for green synthetic metallic NPs
including vanadium and others such as titanium, silver, and nickel
[24-27]. The reported size for the green synthesized vanadium is in
a range of 10 to 100 nm in the literature [28-32].